TPS7301Q, TPS7325Q, TPS7330Q, TPS7333Q, TPS7348Q, TPS7350Q

LOW-DROPOUT VOLTAGE REGULATORS

WITH INTEGRATED DELAYED RESET FUNCTION

SLVS124F – JUNE 1995 – REVISED JANUARY 1999

13

POST OFFICE BOX 655303

shorted to OUT (unless otherwise noted)

PARAMETER

TEST CONDITIONS‡

TJ

MIN

TYP

MAX

UNIT

Output voltage

25

°C

5

V

Output voltage

6 V

≤ VI ≤ 10 V,

5 mA

≤ IO ≤ 500 mA –40°C to 125°C

4.9

5.1

V

IO =10mA

VI = 4 88 V

25

°C

2.9

6

IO = 10 mA,

VI = 4.88 V

–40

°C to 125°C

8

Dropout voltage

IO = 100 mA

VI = 4 88 V

25

°C

27

35

mV

Dropout voltage

IO = 100 mA,

VI = 4.88 V

–40

°C to 125°C

50

mV

IO = 500 mA

VI = 4 88 V

25

°C

146

170

IO = 500 mA,

VI = 4.88 V

–40

°C to 125°C

230

Pass element series resistance

(4.88 V – VO)/IO,

VI = 4.88 V,

25

°C

0.27

0.35

Ω

Pass-element series resistance

(

O) O,

IO = 500 mA

I

,

–40

°C to 125°C

0.5

Ω

Input regulation

VI =6Vto10V

50

µA ≤ IO ≤ 500 mA

25

°C

4

25

mV

Input regulation

VI = 6 V to 10 V,

50

µA ≤ IO ≤ 500 mA

–40

°C to 125°C

45

mV

IO =5mAto500 mA

6V

≤ VI ≤ 10 V

25

°C

30

45

mV

Output regulation

IO = 5 mA to 500 mA,

6 V

≤ VI ≤ 10 V

–40

°C to 125°C

86

mV

Output regulation

IO =50 µA to 500 mA

6V

≤ VI ≤ 10 V

25

°C

45

65

mV

IO = 50 µA to 500 mA, 6 V ≤ VI ≤ 10 V

–40

°C to 125°C

140

mV

IO =50 µA

25

°C

43

53

Ripple rejection

f = 120 Hz

IO = 50 µA

–40

°C to 125°C

38

dB

Ripple rejection

f = 120 Hz

IO = 500 mA

25

°C

41

51

dB

IO = 500 mA

–40

°C to 125°C

36

Output noise-spectral density

f = 120 Hz

25

°C

2

µV/√Hz

Co = 4.7 µF

25

°C

430

Output noise voltage

10 Hz

≤ f ≤ 100 kHz

Co = 10 µF

25

°C

345

µVrms

Co = 100 µF

25

°C

220

RESET trip-threshold voltage

VO decreasing

–40

°C to 125°C

4.55

4.75

V

RESET hysteresis voltage

25

°C

28

mV

RESET output low voltage

IO(RESET) =1 2 mA

VI = 4 25 V

25

°C

0.15

0.4

V

RESET output low voltage

IO(RESET) = – 1.2 mA, VI = 4.25 V

–40

°C to 125°C

0.4

V

† CSR refers to the total series resistance, including the ESR of the capacitor, any series resistance added externally, and PWB trace resistance

to Co.

‡ Pulse-testing techniques are used to maintain virtual junction temperature as close as possible to ambient temperature; thermal effects must

be taken into account separately.