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ADP3625 Datasheet(PDF) 14 Page - Analog Devices

Part # ADP3625
Description  High Speed, Dual, 4 A MOSFET Driver with Thermal Protection
PDF  16 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADP3625 Datasheet(HTML) 14 Page - Analog Devices

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ADP3623/ADP3624/ADP3625/ADP3633/ADP3634/ADP3635
Rev. A | Page 14 of 16
THERMAL CONSIDERATIONS
When designing a power MOSFET gate drive, the maximum
power dissipation in the driver must be considered to avoid
exceeding maximum junction temperature.
Data on package thermal resistance is provided in Table 2 to
help the designer in this task.
There are several equally important aspects that must be
considered.
•
Gate charge of the power MOSFET being driven
•
Bias voltage value used to power the driver
•
Maximum switching frequency of operation
•
Value of external gate resistance
•
Maximum ambient (and PCB) temperature
•
Type of package
All of these factors influence and limit the maximum allowable
power dissipated in the driver.
The gate of a power MOSFET has a nonlinear capacitance
characteristic. For this reason, although the input capacitance
is usually reported in the MOSFET data sheet as CISS, it is not
useful to calculate power losses.
The total gate charge necessary to turn on a power MOSFET
device is usually reported on the device data sheet under QG.
This parameter varies from a few nanocoulombs (nC) to several
hundreds of nC, and is specified at a specific VGS value (10 V
or 4.5 V).
The power necessary to charge and then discharge the gate of a
power MOSFET can be calculated as:
PGATE = VGS × QG × fSW
where:
VGS is the bias voltage powering the driver (VDD).
QG is the total gate charge.
fSW is the maximum switching frequency.
The power dissipated for each gate (PGATE) still needs to be multip-
lied by the number of drivers (in this case, 1 or 2) being used
in each package, and it represents the total power dissipated in
charging and discharging the gates of the power MOSFETs.
Not all of this power is dissipated in the gate driver because part
of it is actually dissipated in the external gate resistor, RG. The
larger the external gate resistor is, the smaller the amount of
power that is dissipated in the gate driver.
In modern switching power applications, the value of the gate
resistor is kept at a minimum to increase switching speed and
minimize switching losses.
In all practical applications where the external resistor is in the
order of a few ohms, the contribution of the external resistor
can be neglected, and the extra loss is assumed in the driver,
providing a good guard band to the power loss calculations.
In addition to the gate charge losses, there are also dc bias
losses, due to the bias current of the driver. This current is
present regardless of the switching.
PDC = VDD × IDD
The total estimated loss is the sum of PDC and PGATE.
PLOSS = PDC + (n × PGATE)
where n is the number of gates driven.
When the total power loss is calculated, the temperature
increase can be calculated as
ΔTJ = PLOSS × θJA
Design Example
For example, consider driving two IRFS4310Z MOSFETs with a
VDD of 12 V at a switching frequency of 300 kHz, using an
ADP3624 in the SOIC_N_EP package.
The maximum PCB temperature considered for this design is 85°C.
From the MOSFET data sheet, the total gate charge is QG = 120 nC.
PGATE = 12 V × 120 nC × 300 kHz = 432 mW
PDC = 12 V × 1.2 mA = 14.4 mW
PLOSS = 14.4 mW + (2 × 432 mW) = 878.4 mW
From the MOSFET data sheet, the SOIC_N_EP thermal
resistance is 59°C/W.
ΔTJ = 878.4 mW × 59°C/W = 51.8°C
TJ = TA + ΔTJ = 136.8°C ≤ TJMAX
This estimated junction temperature does not factor in the
power dissipated in the external gate resistor and, therefore,
provides a certain guard band.
If a lower junction temperature is required by the design,
the MINI_SO_EP package can be used, which provides a
thermal resistance of 43°C/W, so that the maximum junction
temperature is
ΔTJ = 878.4 mW × 43°C/W = 37.7°C
TJ = TA + ΔTJ = 122.7°C ≤ TJMAX
Other options to reduce power dissipation in the driver include
reducing the value of the VDD bias voltage, reducing switching fre-
quency, and choosing a power MOSFET with smaller gate charge.



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