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TPC8405 Datasheet(PDF) 1 Page - Toshiba Semiconductor |
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TPC8405 Datasheet(HTML) 1 Page - Toshiba Semiconductor |
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1 / 11 page ![]() TPC8405 2009-09-29 1 TOSHIBA Field Effect Transistor Silicon N, P Channel MOS Type (P Channel U−MOS IV/N Channel U-MOS III) TPC8405 Lithium Ion Secondary Battery Applications Portable Equipment Applications Notebook PC Applications Low drain-source ON resistance : P Channel RDS (ON) = 25 mΩ (typ.) N Channel RDS (ON) = 20 mΩ (typ.) High forward transfer admittance : P Channel |Yfs| = 12S (typ.) N Channel |Yfs| = 14S (typ.) Low leakage current : P Channel IDSS = −10 μA (VDS = −30 V) N Channel IDSS = 10 μA (VDS = 30 V) Enhancement-mode : P Channel Vth = −0.8 to −2.0 V (VDS = −10 V, ID = −1 mA) N Channel Vth = 1.3 to 2.5 V (VDS = 10 V, ID = 1 mA) Absolute Maximum Ratings (Ta = 25°C) Rating Characteristics Symbol P Channel N Channel Unit Drain-source voltage VDSS −30 30 V Drain-gate voltage (RGS = 20 kΩ) VDGR −30 30 V Gate-source voltage VGSS ±20 ±20 V DC (Note 1) ID −4.5 6 Drain current Pulse (Note 1) IDP −18 24 A Single-device operation (Note 3a) PD (1) 1.5 1.5 Drain power dissipation (t = 10s) (Note 2a) Single-device value at dual operation (Note 3b) PD (2) 1.1 1.1 Single-device operation (Note 3a) PD (1) 0.75 0.75 Drain power dissipation (t = 10s) (Note 2b) Single-device value at dual operation (Note 3b) PD (2) 0.45 0.45 W Single pulse avalanche energy EAS 13.2 (Note 4a) 23.4 (Note 4b) mJ Avalanche current IAR −4.5 6 A Repetitive avalanche energy Single-device value at operation (Note 2a, 3b, 5) EAR 0.1 mJ Channel temperature Tch 150 °C Storage temperature range Tstg −55 to 150 °C Note: For Notes 1 to 5, refer to the next page. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). This transistor is an electrostatic-sensitive device. Handle with care. Unit: mm JEDEC ― JEITA ― TOSHIBA 2-6J1E Weight: 0.080 g (typ.) Circuit Configuration |
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