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MPC5643L Datasheet(PDF) 60 Page - Freescale Semiconductor, Inc |
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MPC5643L Datasheet(HTML) 60 Page - Freescale Semiconductor, Inc |
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60 / 98 page ![]() MPC5643L Microcontroller Data Sheet, Rev. 3 Preliminary—Subject to Change Without Notice Electrical characteristics Freescale Semiconductor 60 3.4 Thermal characteristics VSS_LV_REGCOR 4 SR Internal reference voltage — 0 0 V VDD_LV_CORx 2 SR Internal supply voltage — — — V VSS_LV_CORx 3 SR Internal reference voltage — 0 0 V VDD_LV_PLL 2 SR Internal supply voltage — — — V VSS_LV_PLL 3 SR Internal reference voltage — 0 0 V TA SR Ambient temperature under bias fCPU ≤ 120 MHz –40 125 °C TJ SR Junction temperature under bias — –40 150 °C NOTES: 1 Full functionality cannot be guaranteed when voltage drops below 3.0 V. In particular, ADC electrical characteristics and I/Os DC electrical specification may not be guaranteed. 2 V DD_HV_ADR0 and VDD_HV_ADR1 cannot be operated be operated at different voltages, and need to be supplied by the same voltage source. 3 Can be connected to emitter of external NPN. Low voltage supplies are not under user control. They are produced by an on-chip voltage regulator. 4 For the device to function properly, the low voltage grounds (V SS_LV_xxx) must be shorted to high voltage grounds (VSS_HV_xxx) and the low voltage supply pins (VDD_LV_xxx) must be connected to the external ballast emitter, if one is used. Table 10. Thermal characteristics for 144 LQFP package1 NOTES: 1 Thermal characteristics are targets based on simulation that are subject to change per device characterization. No. Symbol Parameter Conditions Value Unit 1RθJA D Thermal resistance junction-to-ambient natural convection2 2 Junction-to-Ambient thermal resistance determined per JEDEC JESD51-3 and JESD51-6. Thermal test board meets JEDEC specification for this package. Single layer board – 1s TBD °C/W 2RθJA D Thermal resistance junction-to-ambient natural convection2 Four layer board – 2s2p TBD °C/W 5RθJB D Thermal resistance junction-to-board3 3 Junction-to-Board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification for the specified package. —TBD °C/W 6RθJC D Thermal resistance junction-to-case4 4 Junction-to-Case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is used for the case temperature. Reported value includes the thermal resistance of the interface layer. —TBD °C/W 7 Ψ JT D Junction-to-package-top natural convection5 5 Thermal characterization parameter indicating the temperature difference between the package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT. —TBD °C/W Table 9. Recommended operating conditions (3.3 V) (continued) Symbol Parameter Conditions Min Max1 Unit |
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