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CF5075AM-4 Datasheet(PDF) 13 Page - Nippon Precision Circuits Inc |
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CF5075AM-4 Datasheet(HTML) 13 Page - Nippon Precision Circuits Inc |
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13 / 14 page ![]() 5075 series SEIKO NPC CORPORATION —13 Modulation Characteristics Measurement circuit Output Waveform Measurement equipment: Oscilloscope; DSO80604B (Agilent) Measurement circuit VDD = 2.5V, fOUT = 27MHz, Ta = R.T. Frequency [kHz] 10 100 1000 1 0 −3 −6 −9 −12 0 3 VDD = 3.3V, fOUT = 27MHz, Ta = R.T. Frequency [kHz] 10 100 1000 1 0 −3 −6 −9 −12 0 3 C1 = 33µF, R1 = R2 = 1M Ω VC modulation signal: 100Hz to 100kHz, 0 to VDDp-p R1 C1 CLOUT = 15pF 0.1 µF VDD VSS XT Q XTN VC Gain-phase Analyzer (HP 4194A) Modulaiton Analyzer (HP 8901B) Crystal R2 Demodulation signal Modulation signal VDD = 2.5V, 3.3V, fOUT = 27MHz, VC = 0.5VDD, CLOUT = 15pF, Ta = R.T. VDD = 2.5V VDD = 3.3V VDD VSS XT Q Crystal XTN VC 0.1 µF CLOUT = 15pF (Including probe capacitance) |
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