Datasheet

4

Rev. 1.0, 2007-03-20

TLE4309

Note: Stresses above the ones listed here may cause permanent damage to the device.

Exposure to absolute maximum rating conditions for extended periods may affect

device reliability.

Note: Integrated protection functions are designed to prevent IC destruction under fault

conditions described in the data sheet. Fault conditions are considered as

“outside” normal operating range. Protection functions are not designed for

continuous repetitive operation.

Table 2

Absolute Maximum Ratings

Parameter

Symbol

Limit Values

Unit

Remarks

Min.

Max.

Input

Voltage

V

I

-42

45

V

–

Current

I

I

–

–

mA

internally limited

Output

Voltage

V

Q

-1

40

V

–

Current

I

Q

–

–

mA

internally limited

Reference Input

Voltage

V

REF

-1

16

V

–

Current

I

REF

-2

2

mA

–

Pulse Width Modulation / Enable Input

Voltage

V

PWM

-40

40

V

–

Current

I

PWM

-1

1

mA

–

Temperatures

Junction temperature

T

j

-40

150

°C–

Storage temperature

T

stg

-50

150

°C–

ESD Susceptibility

ESD Resistivity

V

ESD,HBM

-2

2

kV

Human Body Model

1)

1) ESD susceptibility, HBM according to EIA/JESD 22-A114B