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ATmega3290P Datasheet(PDF) 246 Page - ATMEL Corporation

Part # ATmega3290P
Description  8-bit Microcontroller with 32K Bytes In-System Programmable Flash
PDF  385 Pages
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Manufacturer  ATMEL [ATMEL Corporation]
Direct Link  http://www.atmel.com
Logo ATMEL - ATMEL Corporation

ATmega3290P Datasheet(HTML) 246 Page - ATMEL Corporation

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246
8021E–AVR–07/09
ATmega329P/3290P
• TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data Register
(Scan Chains).
• TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
The IEEE std. 1149.1 also specifies an optional TAP signal; TRST – Test ReSeT – which is not
provided.
When the JTAGEN fuse is unprogrammed, these four TAP pins are normal port pins and the
TAP controller is in reset. When programmed and the JTD bit in MCUCR is cleared, the TAP
pins are internally pulled high and the JTAG is enabled for Boundary-scan and programming.
The device is shipped with this fuse programmed.
For the On-chip Debug system, in addition to the JTAG interface pins, the RESET pin is moni-
tored by the debugger to be able to detect external reset sources. The debugger can also pull
the RESET pin low to reset the whole system, assuming only open collectors on the reset line
are used in the application.
Figure 23-1. Block Diagram
TAP
CONTROLLER
TDI
TDO
TCK
TMS
FLASH
MEMORY
AVR CPU
DIGITAL
PERIPHERAL
UNITS
JTAG / AVR CORE
COMMUNICATION
INTERFACE
BREAKPOINT
UNIT
FLOW CONTROL
UNIT
OCD STATUS
AND CONTROL
INTERNAL
SCAN
CHAIN
M
U
X
INSTRUCTION
REGISTER
ID
REGISTER
BYPASS
REGISTER
JTAG PROGRAMMING
INTERFACE
PC
Instruction
Address
Data
BREAKPOINT
SCAN CHAIN
ADDRESS
DECODER
ANALOG
PERIPHERIAL
UNITS
I/O PORT 0
I/O PORT n
BOUNDARY SCAN CHAIN
Analog inputs
Control & Clock lines
DEVICE BOUNDARY



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