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TLP115 Datasheet(PDF) 5 Page - Toshiba Semiconductor |
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TLP115 Datasheet(HTML) 5 Page - Toshiba Semiconductor |
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5 / 8 page ![]() TLP115 2002-09-25 5 Test Circuit 1: Switching Time Test Circuit CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 2: Common Mode Transient Immunity Test Circuit s) f t 320(V) L CM s) r t V) 320 H CM m ( = , m ( ( = CL is approximately 15pF which includes probe and stray wiring capacitance. GND VCC Output monitor VO CL IF VCC = 5V Pulse input PW = 100μs Duty ratio = 1 / 10 IF monitor GND VCC Output monitor VC CL IF 5V Pulse generator ZO = 50Ω VCM VO VCM 400V 0V 90% 5V 2V 0.8V VOL tr tf 10% VO (IF = 10mA) (IF = 0mA) VO IF 16mA 8mA 0mA 5V 4.5V 1.5V 0.5V VOL tr tf tpLH tpHL |
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