74ABT657_3

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© NXP B.V. 2010. All rights reserved.

Product data sheet

Rev. 03 — 15 March 2010

7 of 17

NXP Semiconductors

74ABT657

Octal transceiver with parity generator/checker; 3-state

9.

Static characteristics

[1]

transition time of up to 100

µs is permitted.

[2]

Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

[3]

This is the increase in supply current for each input at 3.4 V.

Table 6.

Static characteristics

Symbol Parameter

Conditions

25

°C

−40 °Cto+85 °C Unit

Min

Typ

Max

Min

Max

input clamping voltage

−1.2

−0.9

-

−1.2

-

V

HIGH-level output

voltage

2.5

3.5

-

2.5

-

V

3.0

4.0

-

3.0

-

V

2.0

2.6

-

2.0

-

V

-

0.42

0.55

-

0.55

V

input leakage current

control pins

-

±0.01 ±1.0

-

±1.0

µA

data pins

-

±5

±100

-

±100

µA

power-off leakage

current

-

±5.0 ±100

-

±100

µA

power-up/power-down

output current

[1]

-

±5.0

±50

-

±50

µA

-

5.0

50

-

50

µA

-

−5.0

−50

-

−50

µA

output leakage current

-

5.0

50

-

50

µA

output current

[2]

−180 −100

−50

−180

−50

mA

supply current

outputs HIGH-state

-

0.5

250

-

250

µA

outputs LOW-state

-

20

30

-

30

mA

outputs disabled

-

0.5

250

-

250

µA

additional supply current

or GND

[3]

outputs enabled

-

0.5

1.5

-

1.5

mA

outputs 3-state, one data input

-

50

250

-

250

µA

outputs 3-state; one enable input

-

0.5

1.5

-

1.5

mA

input capacitance

-4-

-

-

pF

input/output capacitance

-7-

-

-

pF