74F269_5

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Product data sheet

Rev. 05 — 25 March 2010

13 of 19

NXP Semiconductors

74F269

8-bit bidirectional binary counter

a. Input pulse definition

b. Test circuit

Test data is given in Table 8.

Definitions for test circuit:

Fig 13. Test circuit for measuring switching times

001aai298

10 %

90 %

90 %

0 V

negative

pulse

positive

pulse

0 V

90 %

10 %

90 %

10 %

10 %

mna616

DUT

CL

RT

RL

RL

G

Table 8.

Test data

Input

Load

3.0 V

1 MHz

500 ns

≤ 2.5 ns

50 pF

500

Ω

open

open

7.0 V