WLCSP16 datasheet(19/38 Pages) NXP

19 / 38 page

LPC1102

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Objective data sheet

Rev. 00 — 23 June 2010

19 of 38

NXP Semiconductors

LPC1102

32-bit ARM Cortex-M0 microcontroller

[2]

The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 5.

[3]

The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after

appropriate adjustment of gain and offset errors. See Figure 5.

[4]

The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the

ideal curve. See Figure 5.

[5]

The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset

error, and the straight line which fits the ideal transfer curve. See Figure 5.

[6]

The absolute error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated

ADC and the ideal transfer curve. See Figure 5.

[7]

Tamb = 25 °C; maximum sampling frequency fs = 4.5 MHz and analog input capacitance Cia = 1 pF.

[8]

Input resistance Ri depends on the sampling frequency fs: Ri = 1 / (fs × Cia).

WLCSP16 Datasheet(PDF) 19 Page - NXP Semiconductors