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TLE4284 Datasheet(PDF) 4 Page - Infineon Technologies AG |
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TLE4284 Datasheet(HTML) 4 Page - Infineon Technologies AG |
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4 / 25 page ![]() Data Sheet 4 Rev. 2.1, 2007-03-20 TLE 4284 Table 3 Absolute Maximum Ratings Note: Stresses above those listed here may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Parameter Symbol Limit Values Unit Test Condition Min. Max. Input - Output Voltage Difference (variable device only) Voltage V I - VQ -0.3 40 V – Input Voltage Voltage V I -0.3 40 V – Output (fixed voltage version only) Voltage V Q -0.3 40 V – Current I Q – – – Internally limited Adjust (variable version only) Voltage V ADJ -0.3 40 V – Current I ADJ – – – Internally limited ESD Susceptibility Human Body Model (HBM) 1) 1) ESD HBM test according to JEDEC JESD22-A114 Class –3– – Voltage –4kV – Charged Device Model (CDM) 2) 2) ESD CDM test according to JEDEC JESD22-C101 Class – F5 – – Voltage –1kV – Temperature Storage temperature T stg -50 150 °C– Junction temperature T j -40 150 °C– |
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