Data Sheet

5

Rev. 1.1, 2009-10-09

TLE42764

General Product Characteristics

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are

not designed for continuous repetitive operation.

4.2

Functional Range

T

1) not subject to production test, specified by design

Pos.

Parameter

Symbol

Limit Values

Unit

Test Condition

Min.

Max.

Input I, Enable EN

4.1.1

Voltage

V

I

-42

45

V

–

Voltage Adjust Input VA

4.1.2

Voltage

V

VA

-0.3

10

V

–

Output Q

4.1.3

Voltage

V

Q

-1

40

V

–

Temperature

4.1.4

Junction temperature

T

j

-40

150

°C–

4.1.5

Storage temperature

T

stg

-50

150

°C–

ESD Susceptibility

4.1.6

ESD Absorption

V

ESD,HBM

-3

3

kV

Human Body Model

2) ESD susceptibility Human Body Model “HBM” according to AEC-Q100-002 - JESD22-A114

4.1.7

V

ESD,CDM

-1000

1000

V

Charge Device

pins

3) ESD susceptibility Charged Device Model “CDM” according to ESDA STM5.3.1

Pos.

Parameter

Symbol

Limit Values

Unit Remarks

Min.

Max.

4.2.1

Input voltage

V

I

5.5

40

V

TLE42764GV50,

TLE42764DV50

4.2.2

Input voltage

V

I

V

40

V

TLE42764GV,

TLE42764DV;

V

4.2.3

Input voltage

V

I

4.5

40

V

TLE42764GV,

TLE42764DV;

V