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ADC1213S Datasheet(PDF) 13 Page - NXP Semiconductors |
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ADC1213S Datasheet(HTML) 13 Page - NXP Semiconductors |
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13 / 39 page ![]() ADC1213S_SER All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 1 — 14 March 2011 13 of 39 NXP Semiconductors ADC1213S series Single 12-bit ADC; serial JESD204A interface 11. Application information 11.1 Analog inputs 11.1.1 Input stage description The analog input of the ADC1213S supports a differential or a single-ended input drive. Optimal performance is achieved using differential inputs with the common-mode input voltage (VI(cm)) on pins INP and INM set to 0.5VDDA. The full-scale analog input voltage range is configurable between 1 V (p-p) and 2 V (p-p) via a programmable internal reference (see Section 11.2 and Table 21). Figure 6 shows the equivalent circuit of the sample-and-hold input stage, including ElectroStatic Discharge (ESD) protection and circuit and package parasitics. The sample phase occurs when the internal clock (derived from the clock signal on pin CLKP/CLKM) is HIGH. The voltage is then held on the sampling capacitors. When the clock signal goes LOW, the stage enters the hold phase and the voltage information is transmitted to the ADC core. 11.1.2 Anti-kickback circuitry Anti-kickback circuitry (RC filter in Figure 7) is needed to counteract the effects of a charge injection generated by the sampling capacitance. The RC filter is also used to filter noise from the signal before it reaches the sampling stage. The value of the capacitor should be chosen to maximize noise attenuation without degrading the settling time excessively. Fig 6. Input sampling circuit 005aaa185 INP package ESD parasitics switch Ron = 15 Ω Cs Cs switch Ron = 15 Ω INM 8 7 internal clock internal clock |
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