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AN601 Datasheet(PDF) 1 Page - Vishay Siliconix |
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AN601 Datasheet(HTML) 1 Page - Vishay Siliconix |
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1 / 8 page ![]() AN601 Vishay Siliconix Document Number: 70572 15-Feb-94 www.vishay.com S FaxBack 408-970-5600 1 Unclamped Inductive Switching Rugged MOSFETs For Rugged Environments The evolution of the power MOSFET has resulted in a very rugged transistor. The semiconductor industry defines this ruggedness as the capability to withstand avalanche currents when subjected to unclamped inductive switching. Historically, MOSFET manufacturers chose to quantify ruggedness, not based principally on individual performance, but rather on comparative performance with other manufacturers. Siliconix has optimized the cell structure of power MOSFETs, resulting in a new class of extremely rugged devices. Today’s avalanche-rated MOSPOWER FET exhibits a ruggedness that far exceeds the performance of any power MOSFET of earlier years. This application note reviews the history of unclamped inductive switching (UIS) and examines various theories pertaining to failure. It further identifies what appears to be two related mechanisms — thermal and bipolar — believed to be responsible for failure during unclamped inductive switching and concludes by recommending how a power MOSFET should be qualified for ruggedness in the data sheet. Two failure modes exist when MOSFETs are subjected to UIS. In this article, these failure mechanisms are labelled as either active or passive. The first, or active mode, results when the avalanche current forces the parasitic bipolar transistor into conduction. The second, or passive mode, results when the instantaneous chip temperature reaches a critical value.[1] At this elevated temperature, a “mesoplasma”* forms within the parasitic npn bipolar transistor and causes catastrophic thermal runaway. In either case, the MOSFET is destroyed. The passive mechanism is, therefore, identified as that failure mode not directly attributed to avalanche currents. Symbols and Definitions Whenever possible, symbols and definitions established by the JEDEC Committee, JC-25, are used in this article. To clear up any discrepancies, however, the following list describes symbols used frequently in this article. IO the peak current reached during avalanche tAV the time duration of the avalanche phenomenon L the value of inductance V(BR)eff the breakdown voltage in avalanche What is Unclamped Inductive Switching? Whenever current through an inductance is quickly turned off, the magnetic field induces a counter electromagnetic force (EMF) that can build up surprisingly high potentials across the switch. Mechanical switches often have spark-suppression circuits to reduce these harmful effects that result when current is suddenly interrupted. However, when transistors are used as the switches, the full buildup of this induced potential may far exceed the rated breakdown (V(BR)DSS) of the transistor, thus resulting in catastrophic failure. If we know the size of the inductor, the amount of current being switched, and the speed of the switch, the expected potential may be easily calculated as V = L di/dt + VDD (1) where L = the inductance (H) di/dt = rate of change of current (A/s) VDD = the supply voltage (V) *A “mesoplasma,” according to Ghandhi, takes the form of a glowing red spot having an average temperature in excess of 650 _C and a peak core temperature in excess of 1000 _C. This mesoplasma is a result of regenerative thermal runaway. |
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