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9FG430AFILF Datasheet(PDF) 5 Page - Integrated Device Technology |
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9FG430AFILF Datasheet(HTML) 5 Page - Integrated Device Technology |
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5 / 18 page ![]() IDT® Four Output Differential Frequency Generator for PCIe Gen3 and QPI 1681C—08/26/10 9FG430 Four Output Differential Frequency Generator for PCIe Gen3 and QPI 5 Electrical Characteristics - Current Consumption PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES IDD3.3 VDD, All outputs active @100MHz 80 95 mA 1 IDDA3.3OP VDDA, All outputs active @100MHz 25 30 mA 1 IDD3.3 VDD, All outputs active @400MHz 100 120 mA 1 IDDA3.3OP VDDA, All outputs active @400MHz 25 30 mA 1 IDD3.3PD VDD, All differential pairs driven 75 90 mA 1 IDDA3.3PD VDDA, All differential pairs driven 25 30 mA 1 IDD3.3PDZ VDD, All differential pairs tri-stated 25 30 mA 1 IDDA3.3PDZ VDDA, All differential pairs tri-stated 25 30 mA 1 1Guaranteed by design and characterization, not 100% tested in production. 2 I REF = VDD/(3xRR). For RR = 475 (1%), IREF = 2.32mA. IOH = 6 x IREF and VOH = 0.7V @ ZO=50 . TA = TCOM or TIND; Supply Voltage VDD = 3.3 V +/-5%, See Test Loads for loading Operating Supply Current Powerdown Current Electrical Characteristics - Output Duty Cycle, Jitter, and Skew Characterisitics PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES Duty Cycle tDC Measured differentially, PLL Mode 45 55 % 1 Skew, Output to Output tsk3 VT = 50% 50 ps 1 Jitter, Cycle to cycle tjcyc-cyc 25M input 50 ps 1,3 Jitter, Cycle to cycle tjcyc-cyc 14.318M input 60 ps 1,3 1Guaranteed by design and characterization, not 100% tested in production. 2 I REF = VDD/(3xRR). For RR = 475 (1%), IREF = 2.32mA. IOH = 6 x IREF and VOH = 0.7V @ ZO=50 . 3 Measured from differential waveform 4 Duty cycle distortion is the difference in duty cycle between the output and the input clock when the device is operated in bypass mode. TA = TCOM or TIND; Supply Voltage VDD = 3.3 V +/-5%, See Test Loads for loading Electrical Characteristics - DIF 0.7V Current Mode Differential Outputs TA = TCOM or TIND; Supply Voltage VDD = 3.3 V +/-5%; See Test Loads s for loading conditions. PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES Slew rate Trf Scope averaging on 1 4 V/ns 1, 2, 3 Slew rate matching ∆Trf Slew rate matching, Scope averaging on 20 % 1, 2, 4 Voltage High VHigh 660 850 1 Voltage Low VLow -150 150 1 Max Voltage Vmax 1150 1 Min Voltage Vmin -300 1 Vswing Vswing Scope averaging off 300 mV 1, 2 Crossing Voltage (abs) Vcross_abs Scope averaging off 250 550 mV 1, 5 Crossing Voltage (var) ∆-Vcross Scope averaging off 140 mV 1, 6 2 Measured from differential waveform 6 The total variation of all Vcross measurements in any particular system. Note that this is a subset of V_cross_min/max (V_cross absolute) allowed. The intent is to limit Vcross induced modulation by setting V_cross_delta to be smaller than V_cross absolute. mV Statistical measurement on single-ended signal using oscilloscope math function. (Scope averaging on) Measurement on single ended signal using absolute value. (Scope averaging off) mV 1Guaranteed by design and characterization, not 100% tested in production. IREF = VDD/(3xR R). For RR = 475 (1%), IREF = 2.32mA. IOH = 6 x IREF and VOH = 0.7V @ ZO=50 (100 differential impedance). 3 Slew rate is measured through the Vswing voltage range centered around differential 0V. This results in a +/-150mV window around differential 0V. 4 Matching applies to rising edge rate of Clock / falling edge rate of Clock#. It is measured in a +/-75mV window centered on the average cross point where Clock rising meets Clock# falling. The median cross point is used to calculate the voltage thresholds the oscilloscope uses for the edge rate calculations. 5 Vcross is defined as voltage where Clock = Clock# measured on a component test board and only applies to the differential rising edge (i.e. Clock rising and Clock# falling). |
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