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AFS090 Datasheet(PDF) 125 Page - Microsemi Corporation |
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AFS090 Datasheet(HTML) 125 Page - Microsemi Corporation |
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125 / 334 page ![]() Fusion Family of Mixed Signal FPGAs R e visio n 2 2 - 109 connected between the VAREF and ADCGNDREF pins. The VAREFSEL control pin is used to select the reference voltage. ADC Clock The speed of the ADC depends on its internal clock, ADCCLK, which is not accessible to users. The ADCCLK is derived from SYSCLK. Input signal TVC[7:0], Time Divider Control, determines the speed of the ADCCLK in relationship to SYSCLK, based on EQ 15. EQ 15 TVC: Time Divider Control (0–255) tADCCLK is the period of ADCCLK, and must be between 0.5 MHz and 10 MHz tSYSCLK is the period of SYSCLK The frequency of ADCCLK, fADCCLK, must be within 0.5 Hz to 10 MHz. The inputs to the ADC are synchronized to SYSCLK. A conversion is initiated by asserting the ADCSTART signal on a rising edge of SYSCLK. Figure 2-88 on page 2-113 and Figure 2-89 on page 2-114 show the timing diagram for the ADC. Acquisition Time or Sample Time Control Acquisition time (tSAMPLE) specifies how long an analog input signal has to charge the internal capacitor array. Figure 2-86 shows a simplified internal input sampling mechanism of a SAR ADC. The internal impedance (ZINAD), external source resistance (RSOURCE), and sample capacitor (CINAD) form a simple RC network. As a result, the accuracy of the ADC can be affected if the ADC is given insufficient time to charge the capacitor. To resolve this problem, you can either reduce the source resistance or increase the sampling time by changing the acquisition time using the STC signal. EQ 16 through EQ 18 can be used to calculate the acquisition time required for a given input. The STC signal gives the number of sample periods in ADCCLK for the acquisition time of the desired signal. If the actual acquisition time is higher than the STC value, the settling time error can affect the accuracy of the ADC, because the sampling capacitor is only partially charged within the given sampling cycle. Example acquisition times are given in Table 2-44 and Table 2-45. When controlling the sample time for the ADC Table 2-42 • VAREF Bit Function Name Bit Function VAREF 0 Reference voltage selection 0 – Internal voltage reference selected. VAREF pin outputs 2.56 V. 1 – Input external voltage reference from VAREF and ADCGNDREF Table 2-43 • TVC Bits Function Name Bits Function TVC [7:0] SYSCLK divider control Figure 2-86 • Simplified Sample and Hold Circuitry tADCCLK 41 TVC + () × tSYSCLK × = Sample and Hold ZINAD CINAD Rsource |
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