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AH921 Datasheet(PDF) 9 Page - BCD Semiconductor Manufacturing Limited |
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AH921 Datasheet(HTML) 9 Page - BCD Semiconductor Manufacturing Limited |
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9 / 14 page ![]() Preliminary Datasheet HIGH SENSITIVITY CMOS HALL-EFFECT LATCH AH921 Jun. 2010 Rev. 1. 0 BCD Semiconductor Manufacturing Limited 9 Test Circuit and Test Conditions (Continued) Figure 10. Test Condition of AH921 (Output Leakage Current) Note 9: The device is put under the magnetic field: B<BRP. Typical Performance Characteristics Figure 11. ICC vs. VCC Figure 12. ICC vs. TA 4 6 8 10 12 14 16 18 20 22 24 1.0 1.5 2.0 2.5 3.0 3.5 4.0 V CC (V) T A=25 oC -25 0 25 50 75 100 125 1.5 2.0 2.5 3.0 3.5 4.0 T A ( oC) V CC=5V V CC=12V |
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