Z0107NN

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© NXP B.V. 2011. All rights reserved.

Product data sheet

Rev. 05 — 22 March 2011

9 of 14

NXP Semiconductors

Z0107NN

4Q Triac

Fig 12. Normalized gate trigger voltage as a function of

junction temperature

Fig 13. Normalized critical rate of rise of off-state

voltage as a function of junction temperature;

typical values

Fig 14. Transient thermal impedance from junction to ambient as a function of pulse duration, FET2 (PCB used for

thermal tests; heat sink area 400mm2)

-50

150

100

050

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0.8

0.4

1.2

1.6

0

1.6

1.2

0.8

0.4

0

A

0

50

100

150

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003aad209

single shot

0.2

0.1

0.05

0.02

10

-2

10

-1

1

10

10

2

10

-5

10

-4

10

-3

10

-2

10

-1

1

10

10

2

10

3

10

4

(K/W)

δ = 0.5

10

-6

T

P

t

T

δ =