TLE 4265

Semiconductor Group

5

1998-11-01

Optimum reliability and lifetime can be ensured in integrated circuits by not exceeding a

junction temperature of 125

°C during operation. Although operation up to the maximum

permissible junction temperature of 150

°C is possible, such boundary conditions, if

sustained, may affect device reliability.

Thermal Resistance

Junction ambient

R

thja

–70

K/W –

Junction-case

R

thjc

–10

K/W –

Characteristics

V

Parameter

Symbol

Limit Values

Unit Test Condition

min.

typ.

max.

Output voltage

V

Q

4.95

5.1V

5 mA

6 V

– 40

Output-current limiting

I

Q

200

250

–

mA

–

Current consumption

I

I

q

–

750

1000

µA

I

Current consumption

I

I

q

–

1015mA

I

Current consumption

I

I

q

–

1520mA

I

V

Drop voltage

V

Dr

–

0.35

0.5

V

I

1)

Load regulation

Q

––

25

mV

I

Absolute Maximum Ratings (cont’d)

T

Parameter

Symbol

Limit Values

Unit Notes

min.

max.