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MPC5645S Datasheet(PDF) 65 Page - Freescale Semiconductor, Inc

Part # MPC5645S
Description  Qorivva MPC5645S Microcontroller Data Sheet
PDF  146 Pages
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MPC5645S Datasheet(HTML) 65 Page - Freescale Semiconductor, Inc

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Qorivva MPC5645S Microcontroller Data Sheet, Rev. 8
Freescale Semiconductor
65
4.5.1
General notes for specifications at maximum junction temperature
An estimate of the chip junction temperature, TJ, can be obtained from the equation:
TJ = TA + (RJA * PD)
Eqn. 1
where:
TA= ambient temperature for the package (
oC)
RJA= junction to ambient thermal resistance (
oC/W)
PD= power dissipation in the package (W)
JT
CC
D Junction to Package Top Natural Convec-
tion5
2
°C/W
D3.14
1 Thermal characteristics are targets based on simulation that are subject to change per device characterization.
2 Junction-to-Ambient Thermal Resistance determined per JEDEC JESD51-3 and JESD51-6. Thermal test board meets JEDEC
specification for this package.
3 Junction-to-Board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification for
the specified package.
4 Junction-to-Case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is used
for the case temperature. Reported value includes the thermal resistance of the interface layer.
5 Thermal characterization parameter indicating the temperature difference between the package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as
Psi-JT.
Table 15. Thermal characteristics for 416-pin TEPBGA1
1 Thermal characteristics are targets based on simulation that are subject to change per device characterization.
Symbol
C
Parameter
Conditions
Value
Unit
SpecID
RJA
CC
D Junction to Ambient Natural Convection2
2 Junction-to-Ambient Thermal Resistance determined per JEDEC JESD51-3 and JESD51-6. Thermal test board meets
JEDEC specification for this package.
Single layer board - 1s
26
°C/W
D3.15
RJA
CC
D Junction to Ambient Natural Convection2
Four layer board - 2s2p
18
°C/W
D3.16
RJMA
CC
D Junction to Ambient2
@200 ft./min., single layer
board - 1s
20
°C/W
D3.17
RJMA
CC
D Junction to Ambient2
@200 ft./min., Four layer
board - 2s2p
15
°C/W
D3.18
RJB
CC
D Junction to Board3
3 Junction-to-Board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification for
the specified package.
10
°C/W
D3.19
RJCtop
CC
D Junction to Case (Top)4
4 Junction-to-Case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is used
for the case temperature. Reported value includes the thermal resistance of the interface layer.
6
°C/W
D3.20
JT
CC
D Junction to Package Top Natural Convec-
tion5
5 Thermal characterization parameter indicating the temperature difference between the package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written
as Psi-JT.
2
°C/W
D3.21
Table 14. Thermal characteristics for 208-pin LQFP1 (continued)
Symbol
C
Parameter
Conditions
Value
Unit
SpecID



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