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LRI1K Datasheet(PDF) 77 Page - STMicroelectronics |
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LRI1K Datasheet(HTML) 77 Page - STMicroelectronics |
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77 / 86 page ![]() LRI1K Maximum rating Doc ID 17170 Rev 3 77/86 21 Maximum rating Stressing the device above the rating listed in the absolute maximum ratings table may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. Table 88. Absolute maximum ratings Symbol Parameter Min. Max. Unit TSTG Storage temperature Wafer (kept in its antistatic bag) 15 25 °C tSTG Storage time Wafer (kept in its antistatic bag) 23 months ICC Supply current on AC0 / AC1 –20 20 mA VMAX Input voltage on AC0 / AC1 –7 7 V VESD Electrostatic discharge voltage(1) 1. AEC-Q100-002 (compliant with JEDEC Std JESD22-A114A, C1=100pF, R1=1500 Ohms, R2=500 Ohms). UFDFPN8 (HBM(2)) 2. Human body model. –1000 1000 V UFDFPN8 (MM(3)) 3. Machine model. –100 100 V |
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