AD760 datasheet(5/12 Pages) AD

5 / 12 page

AD760

REV. A

–5–

ORDERING GUIDE

Temperature

Package

Model

Range

Description

Option

AD760AQ

–40°C to +85°C

Cerdip

Q-28

WARNING!

ESD SENSITIVE DEVICE

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection.

Although the AD760 features proprietary ESD protection circuitry, permanent damage may

occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD

precautions are recommended to avoid performance degradation or loss of functionality.

ABSOLUTE MAXIMUM RATINGS*

VCC to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +17.0 V

VEE to AGND . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –17.0 V

VLL to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V

AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±1 V

Digital Inputs (Pins 2, 7–14, and 16–21)

to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . –1.0 V to +7.0 V

REF IN to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±10.5 V

Span/Bipolar Offset to AGND . . . . . . . . . . . . . . . . . . . ±10.5 V

REF OUT, VOUT, MUXOUT, MUXIN . . . . . Indefinite Short to

AGND, DGND, VCC, VEE, and VLL

JA, Thermal Impedance

. . . . . . . . . . . . . . . . . . . . . . . 50°C/W

Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 175°C

Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C

Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . . +300°C

*Stresses above those listed under “Absolute Maximum Ratings” may cause

permanent damage to the device. This is a stress rating only and functional

operation of the device at these or any other conditions above those indicated in the

operational section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

CALOK

CAL

MUX

DGND

DB7, 15

SPAN/BIP OFF

OUT

AGND

–V

REF OUT

REF IN

DB6, 14

LDAC

DB5, 13

CLR

DB4, 12

SER

DB3, 11

HBE

DB2, 10, 18/16 SERIAL

LBE, UNI/BIP CLR

DB1, 9, MSB/LSB

DB0, 8, S

OUT

TOP VIEW

(Not to Scale)

AD760

MUX

OUT

PIN CONFIGURATION

DIP

tCLR

tHOLD

"1"= BIP, "0"= UNI

tSET

CLR

UNI/BIP

CLR

Figure 1c. Asynchronous Clear to Bipolar or Unipolar Zero

tBUSY

CAL

CALOK

HBE

tCAL

tCD

tCS

tCV

Figure 1d. Calibration Timing

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