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AMP02FS Datasheet(PDF) 4 Page - Analog Devices

Part # AMP02FS
Description  High Accuracy 8-Pin Instrumentation Amplifier
PDF  12 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AMP02FS Datasheet(HTML) 4 Page - Analog Devices

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AMP02
REV. D
–4–
WARNING!
ESD SENSITIVE DEVICE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AMP02 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
DIE SIZE 0.103 X 0.116 inch, 11,948 sq. mils
(2.62 X 2.95 mm, 7.73 sq. mm)
Dice Characteristics
1. RG1
2. –IN
3. +IN
4. V–
5. REFERENCE
6. OUT
7. V+
8. RG2
9. SENSE
CONNECT SUBSTRATE TO V–
WAFER TEST LIMITS at V
S =
15 V, VCM = 0 V, TA = +25 C, unless otherwise noted.
AMP02 GBC
Parameter
Symbol
Conditions
Limits
Units
Input Offset Voltage
VIOS
200
µV max
Output Offset Voltage
VOOS
8
mV max
VS = ± 4.8 V to ± 18 V
G = 1000
110
Power Supply
PSR
G = 100
110
dB min
Rejection
G = 10
95
G = 1
75
Input Bias Current
IB
20
nA max
Input Offset Current
IOS
10
nA max
Input Voltage Range
IVR
Guaranteed by CMR Tests
±11
V min
VCM =
±11 V
G = 1000
110
Common-Mode
CMR
G = 100
110
dB min
Rejection
G = 10
95
G = 1
75
Gain Equation Accuracy
G
=
50 k
Ω
R
G
+ 1, G = 1000
0.7
% max
Output Voltage Swing
VOUT
RL = 1 k
Ω±12
V min
Supply Current
ISY
6
mA max
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.



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