LKT datasheet(5/8 Pages) KINGTRONICS

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LKT

Low Voltage Multilayer Chip Ceramic

Capacitor

11. Bending

Dielectrics

Specification

Testing Condition

NPO

No remarkable visual damage

Cp change ≤ ±5% or ≤ 0.5 pF

Solder the capacitor on testing substrate and put it on

testing stand. The middle part of substrate shall

successively be pressurized by pressuring rod at a rated of

about 1.0mm/sec. Until the deflection become means of the

1.0mm.

X7R/X5R

No remarkable visual damage

Cp change ≤ ±12.5%

Y5V

No remarkable visual damage

Cp change ≤ ±30%

12. Resistance to Soldering Heat

Dielectrics

Specification

Testing Condition

NPO

No remarkable visual damage

Cp change within ±2.5% or ±0.25pF,

whichever is larger.

DF meets initial standard value.

IR meets initial standard value.

Soldering temperature: 270±5℃

Preheating: 120~150

60sec.

℃

Dipping time: 10±1 seconds.

Measurement to be made after being kept at room

temperature for 24±2 (COG) or 48±4(X7R ,X5R, Y5V)

hours.

Recovery for the following period under the standard

condition after test.

*Initial measurement for high dielectric constant type

Perform a heat treatment at 140~150

for 1hr and let sit

℃

for 48±4hrs at room temperature. Perform the initial

measurement.

X7R/X5R

No remarkable visual damage

Cp change within ±5%

DF meets initial standard value.

IR meets initial standard value.

Y5V

No remarkable visual damage

Cp change within ±20%

DF meets initial standard value.

IR meets initial standard value.

13. Temperature Cycle

Dielectrics

Specification

Testing Condition

NPO

No remarkable visual damage

Cp change within ±2.5% or ±0.25pF,

whichever is larger.

To perform 5 cycles of the stated environment:

Step

Temperature

Time

Min. operating Temp.+0/-3℃

30min

25℃

2~3 min

Max. operating Temp.+0/-3℃

30 min

X7R/X5R

No remarkable visual damage

Cp change within ±7.5%

25℃

2~3 min

Measurement to be made after being kept at room

temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R,

Y5V) at room temperature, then measure.

*Initial measurement for high dielectric constant type

Perform a heat treatment at 140~150℃ for 1hr and let sit

for 48±4hrs at room temperature.

Perform the initial measurement.

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