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MAX1124 Datasheet(PDF) 13 Page - Maxim Integrated Products |
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MAX1124 Datasheet(HTML) 13 Page - Maxim Integrated Products |
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13 / 21 page ![]() 1.8V, Low-Power, 12-Bit, 250Msps ADC for Broadband Applications ______________________________________________________________________________________ 13 System Timing Requirements Figure 5 depicts the relationship between the clock input and output, analog input, sampling event, and data output. The MAX1215N samples on the rising (falling) edge of CLKP (CLKN). Output data is valid on the next rising (falling) edge of the DCLKP (DCLKN) clock, but has an internal latency of 11 clock cycles. Digital Outputs (D0P/N–D11P/N, DCLKP/N, ORP/N) and Control Input T/B Digital outputs D0P/N–D11P/N, DCLKP/N, and ORP/N are LVDS compatible, and data on D0P/N–D11P/N is presented in either binary or two’s-complement format (Table 1). The T/B control line is an LVCMOS-compati- ble input, which allows the user to select the desired output format. Pulling T/B low outputs data in two’s complement, and pulling it high presents data in offset binary format on the 12-bit parallel bus. T/B has an internal pulldown resistor and may be left unconnected in applications using only two’s-complement output for- mat. All LVDS outputs provide a typical 360mV voltage swing around a 1.24V common-mode voltage, and must be terminated at the far end of each transmission line pair (true and complementary) with 100Ω. Apply a 1.7V to 1.9V voltage supply at OVCC to power the LVDS outputs. The MAX1215N offers an additional differential output pair (ORP, ORN) to flag out-of-range conditions, where out-of-range is above positive or below negative full scale. An out-of-range condition is identified with ORP (ORN) transitioning high (low). Note: Although a differential LVDS output architecture reduces single-ended transients to the supply and ground planes, capacitive loading on the digital out- puts should still be kept as low as possible. Using LVDS buffers on the digital outputs of the ADC when driving larger loads may improve overall performance and reduce system-timing constraints. INP INN SAMPLING EVENT SAMPLING EVENT SAMPLING EVENT SAMPLING EVENT SAMPLING EVENT CLKN CLKP DCLKN DCLKP D0P/D0N– D11P/D11N ORP/N N N-11 N-10 N - 1 N + 1 N N N - 1 N - 9 N - 10 N - 11 N + 1 N + 1 N + 11 N + 10 N + 12 tAD tPDL tLATENCY tCPDL tCPDL - tPDL~ 0.4 x tSAMPLE WITH tSAMPLE = 1 / fSAMPLE NOTE: THE ADC SAMPLES ON THE RISING EDGE OF CLKP. THE RISING EDGE OF DCLKP CAN BE USED TO EXTERNALLY LATCH THE OUTPUT DATA. tCH tCL Figure 5. System and Output Timing Diagram 2.89kΩ AVDD AGND CLKN CLKP 5.35kΩ 5.35kΩ 5.35kΩ Figure 4. Simplified Clock Input Architecture |
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