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LTC1703

1703fa

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: PVCC and BVCC (VBOOST – VSW) must be greater than VGS(ON) of

the external MOSFETs used to ensure proper operation.

Note 3: All currents into device pins are positive; all currents out of device

pins are negative. All voltages are referenced to ground unless otherwise

specified.

Note 4: Supply current in normal operation is dominated by the current

needed to charge and discharge the external MOSFET gates. This current

will vary with supply voltage and the external MOSFETs used.

Note 5: Supply current in shutdown is dominated by external MOSFET

leakage and may be significantly higher than the quiescent current drawn

by the LTC1703, especially at elevated temperature.

Note 6: This parameter is guaranteed by correlation and is not tested

directly.

Note 7: Each built-in pull-up resistor attached to the VID inputs also has a

series diode connected to VCC to allow input voltages higher than the VCC

supply without damage or clamping. (See Block Diagram.)

Note 8: Feedback current at FB1 will be higher due to internal VID

resistors.

Note 9: Rise and fall times are measured using 10% and 90% levels. Delay

and nonoverlap times are measured using 50% levels.

The

● denotes specifications which apply over the full operating

temperature range, otherwise specifications are TA = 25°C. VCC = 5V unless otherwise specified. (Note 3)

ELECTRICAL CHARACTERISTICS

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Switching Characteristics

VOSC

Oscillator Amplitude

1VP-P

fOSC

Oscillator Frequency

Test Circuit 1

●

475

550

750

kHz

ΦOSC2

Controller 2 Oscillator Phase

Relative to Controller 1

180

DEG

DCMIN1

Minimum Duty Cycle

VFB < VMAX

●

710

DCMIN2

Minimum Duty Cycle

VFB > VMAX

●

DCMAX

Maximum Duty Cycle

●

tNOV

Driver Nonoverlap

Test Circuit 1 (Note 9)

●

100

tr, tf

Driver Rise/Fall Time

Test Circuit 1 (Note 9)

●

Feedback Amplifier

AVFB

FB DC Gain

●

GBW

FB Gain Bandwidth

MHz

IERR

FB Sink/Source Current

COMPN Output

●

±3

±10

VMIN

MIN Comparator Threshold

●

760

785

VMAX

MAX Comparator Threshold

●

815

840

Current Limit Loop

AVILIM

ILIM Gain

IIMAX

IMAX Source Current

IMAX = 0V, LTC1703C

●

–7

–10

–13

µA

IMAX = 0V, LTC1703I

●

–7

–10

–14

µA

Status Outputs

VFAULT

FAULT Trip Point

VFB Relative to Regulated VOUT

●

+10

+15

+20

VOLF

FAULT Output Low Voltage

IFAULT = 1mA

●

0.03

0.1

IFAULT

FAULT Output Current

VFAULT = 0V

– 10

µA

tFAULT

FAULT Delay Time

VFB > VFAULT to FAULT

(Note 9)

µs

VID Inputs

R11

Resistance Between SENSE and FB1

Ω

VOUT Error % Output Voltage Accuracy (Side 1)

Programmed from 0.9V to 2V

●

– 1.5

1.5

RPULLUP

VID Input Pull-Up Resistance

VDIODE = 0.6V (Note 7)

Ω

VIDT

VID Input Voltage Threshold

VIL (2.7V ≤ VCC ≤ 5.5V)

0.4

VIH (2.7V ≤ VCC ≤ 5.5V)

1.6

IVID-LEAK

VID Input Leakage Current

VCC < VID < 7V (Note 7)

0.01

±1

µA

VPULLUP

VID Pull-Up Voltage

VCC = 3.3V

2.8

VCC = 5V

4.5

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