ADM213EAR datasheet(13/20 Pages) AD

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burst of sparks as the relay contacts separate. The voltage

appearing on the line, therefore, consists of a burst of extremely

fast transient impulses. A similar effect occurs when switching

on fluorescent lights.

The fast transient burst test defined in IEC 1000-4-4 simulates

this arcing; its waveform is illustrated in Figure 29. It consists of

a burst of 2.5 kHz to 5 kHz transients repeating at 300 ms

intervals. It is specified for both power and data lines.

300ms

15ms

5ns

0.2ms/0.4ms

50ns

Figure 29. IEC 1000-4-4 Fast Transient Waveform

Table 9.

Level

V Peak (kV)

PSU

V Peak (kV)

I/O

0.5

0.25

0.5

A simplified circuit diagram of the actual EFT generator is

illustrated in Figure 30.

The transients are coupled onto the signal lines using an EFT

coupling clamp. The clamp is 1 m long and surrounds the cable

completely, providing maximum coupling capacitance (50 pF to

200 pF typical) between the clamp and the cable. High energy

transients are capacitively coupled onto the signal lines. Fast rise

times (5 ns), as specified by the standard, result in very effective

coupling. Because high voltages are coupled onto the signal

lines, this test is very severe. The repetitive transients can often

cause problems where single pulses do not. Destructive latch-up

can be induced due to the high energy content of the transients.

Note that this stress is applied while the interface products are

powered up and are transmitting data. The EFT test applies

hundreds of pulses with higher energy than ESD. Worst-case

transient current on an I/O line can be as high as 40 A.

Test results are classified according to the following:

•

Classification 1: Normal performance within speci-

fication limits.

•

Classification 2: Temporary degradation or loss of

performance that is self recoverable.

•

Classification 3: Temporary degradation or loss of function

or performance that requires operator intervention or

system reset.

•

Classification 4: Degradation or loss of function that is not

recoverable due to damage.

ADM2xxE products meet Classification 2 and have been tested

under worst-case conditions using unshielded cables. Data

transmission during the transient condition is corrupted, but it

can resume immediately following the EFT event without user

intervention.

50Ω

OUTPUT

HIGH

VOLTAGE

SOURCE

Figure 30. IEC 1000-4-4 Fast Transient Generator

IEC 1000-4-3 RADIATED IMMUNITY

IEC 1000-4-3 (previously IEC 801-3) describes the measure-

ment method and defines the levels of immunity to radiated

electromagnetic fields. It was originally intended to simulate the

electromagnetic fields generated by portable radio transceivers

or any other devices that generate continuous wave-radiated

EM energy. Its scope has since been broadened to include

spurious EM energy that can be radiated from fluorescent

lights, thyristor drives, inductive loads, and other sources.

Testing for immunity involves irradiating the device with an EM

field. There are various methods of achieving this, including use of

anechoic chamber, stripline cell, TEM cell, and GTEM cell. A

stripline cell consists of two parallel plates with an electric field

developed between them. The device under test is placed within

the cell and exposed to the electric field. There are three severity

levels having field strengths ranging from 1 V/m to 10 V/m.

Results are classified in a similar fashion to those for IEC 100044.

•

Classification 1: Normal operation.

•

Classification 2: Temporary degradation or loss of function

that is self recoverable when the interfering signal is

removed.

•

Classification 3: Temporary degradation or loss of function

that requires operator intervention or system reset when

the interfering signal is removed.

•

Classification 4: Degradation or loss of function that is not

recoverable due to damage.

The ADM2xxE family of products easily meets Classification 1 at

the most stringent requirement (Level 3). In fact, field strengths

up to 30 V/m showed no performance degradation, and error-

free data transmission continued even during irradiation.

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