LMV7235, LMV7239

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SNOS532M – SEPTEMBER 2000 – REVISED FEBRUARY 2013

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1) (2)

Human Model Body

1000V

Machine Body

100V

Differential Input Voltage

± Supply Voltage

Output Short Circuit Duration

(4)

6V

Soldering Information

Infrared or Convection (20 sec)

235°C

Wave Soldering (10 sec)

260°C (lead temp)

Voltage at Input/Output Pins

−0.3V

±10mA

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical Characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office / Distributors for

availability and specifications.

(3)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC)Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(4)

Applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated ambient temperature can result in

exceeding the maximum allowed junction temperature of 150°C. Output currents in excess of ±30mA over long term may adversely

affect reliability.

(5)

Limiting input pin current is only necessary for input voltages that exceed absolute maximum input voltage ratings.

Operating Ratings

2.7V to 5.5V

LMV7235/LMV7239

−40°C to +85°C

LMV7239Q

−40°C to +125°C

Storage Temperature Range

−65°C to +150°C

Package Thermal Resistance

5-Pin SC70

478°C/W

5-Pin SOT-23

265°C/W

(1)

2.7V Electrical Characteristics

temperature extremes.

Symbol

Parameter

Conditions

Units

0.8

6

Input Offset Voltage

mV

8

30

400

Input Bias Current

nA

600

5

200

Input Offset Current

nA

400

(1)

All limits are guaranteed by testing or statistical analysis.

(2)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on

shipped production material.

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