PCM1725D datasheet(3/14 Pages) TI

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PCM1725

PIN ASSIGNMENTS

NAME

I/O

FUNCTION

1(1)

LRCIN

Sample Rate Clock Input

2(1)

DIN

Audio Data Input

3(1)

BCKIN

Bit Clock Input for Audio Data.

—

No Connection

CAP

—

Common Pin of Analog Output Amp

6VOUTR

OUT

Right-Channel Analog Output

GND

—

Ground

8VCC

—

Power Supply

9VOUTL

OUT

Left-Channel Analog Output

—

No Connection

—

No Connection

12(2)

De-emphasis Control

HIGH: De-emphasis ON

LOW: De-emphasis OFF

13(2) FORMAT

—

Audio Data Format Select

HIGH: I2S Data Format

LOW: Standard Data Format

SCKI

System Clock Input (256fS or 384fS)

NOTES: (1) Schmitt Trigger input. (2) Schmitt Trigger input with internal

pull-up.

PIN CONFIGURATION

TOP VIEW

SOIC

LRCIN

DIN

BCKIN

CAP

OUTR

GND

SCKI

FORMAT

OUTL

PCM1725

PACKAGE INFORMATION

PACKAGE DRAWING

PRODUCT

PACKAGE

NUMBER(1)

PCM1725U

14 Pin SOIC

235

NOTE: (1) For detailed drawing and dimension table, please see end of data

sheet, or Appendix C of Burr-Brown IC Data Book.

ABSOLUTE MAXIMUM RATINGS

Power Supply Voltage ....................................................................... +6.5V

+VCC to +VDD Difference ................................................................... ±0.1V

Input Logic Voltage .................................................. –0.3V to (VDD + 0.3V)

Power Dissipation .......................................................................... 290mW

Operating Temperature Range ......................................... –25

°C to +85°C

Storage Temperature ...................................................... –55

°C to +125°C

Lead Temperature (soldering, 5s) .................................................. +260

°C

Thermal Resistance,

JA .............................................................. +90°C/W

ELECTROSTATIC

DISCHARGE SENSITIVITY

This integrated circuit can be damaged by ESD. Burr-Brown

recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling

and installation procedures can cause damage.

ESD damage can range from subtle performance degradation

to complete device failure. Precision integrated circuits may

be more susceptible to damage because very small parametric

changes could cause the device not to meet its published

specifications.

Not Recommended For New Designs

PCM1725D Datasheet(PDF) 3 Page - Texas Instruments

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