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PE9313 Datasheet(PDF) 2 Page - Peregrine Semiconductor |
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PE9313 Datasheet(HTML) 2 Page - Peregrine Semiconductor |
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2 / 7 page ![]() Product Specification PE9313 Page 2 of 7 ©2003-2006 Peregrine Semiconductor Corp. All rights reserved. Document No. 70-0120-03 │ UltraCMOS™ RFIC Solutions Table 2. Pin Descriptions Table 3. Absolute Maximum Ratings Device Functional Considerations The PE9313 divides an input signal, up to a frequency of 1500 MHz, by a factor of eight thereby producing an output frequency at an eighth of the input frequency. To work properly at higher frequency, the input and output signals (pins 2 & 7) must be AC coupled via an external capacitor, as shown in the test circuit in Figure 7. The input may be DC coupled for low frequency operation with care taken to remain within the specified DC input range for the device. The ground pattern on the board should be made as wide as possible to minimize ground impedance. See Figure 8 for a layout example. Figure 3. Pin Configuration PE9313 1 2 3 4 8 7 6 5 IN GND N/C GND OUT VDD NC GND Pin No. Pin Name Description 1 VDD Power supply pin. Bypassing is required (eg 1000 pF & 100 pF). 2 IN Input signal pin. Should be coupled with a capacitor (eg 1000 pF). 3 NC No connection. This pin should be left open. 4 GND Ground pin. Ground pattern on the board should be as wide as possible to reduce ground impedance. 5 GND Ground pin. 6 NC No connection. This pin should be left open. 7 OUT Divided frequency output pin. This pin should be coupled with a capacitor (eg 1000 pF). 8 GND Ground Pin. Symbol Parameter/Conditions Min Max Units VDD Supply voltage 4.0 V Pin Input Power 15 dBm VIN Voltage on input -0.3 VDD +0.3 V TST Storage temperature range -65 150 °C TOP Operating temperature range -40 85 °C VESD ESD voltage (Human Body Model, MIL-STD 883) 1000 V Electrostatic Discharge (ESD) Precautions When handling this UltraCMOS™ device, observe the same precautions that you would use with other ESD-sensitive devices. Although this device contains circuitry to protect it from damage due to ESD, precautions should be taken to avoid exceeding the rating specified in Table 3. Latch-Up Avoidance Unlike conventional CMOS devices, UltraCMOS™ devices are immune to latch-up. Absolute Maximum Ratings are those values listed in the above table. Exceeding these values may cause permanent device damage. |
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