5833

BiMOS II 32-BIT

SERIAL-INPUT,

LATCHED DRIVER

TRUTH TABLE

Serial

Shift Register Contents

Serial

Latch Contents

Output

Output Contents

Data

Clock

Data

Strobe

Enable

Input

...

Output

Input

...

Input

HH

LL

XXX...

X

X

X

L

X

X

X

...

X

X

L

H

H

H

... H

H

L = Low Logic Level

H = High Logic Level

X = Irrelevant

P = Present State

R = Previous State

ELECTRICAL CHARACTERISTICS at T

A

= +25

DD

= 5 V (unless otherwise noted).

Limits

Characteristic

Symbol

Test Conditions

Min.

Max.

Units

Output Leakage Current

I

CEX

V

OUT

= 30 V, T

A

= 70

°C—

10

µA

Collector-Emitter

V

CE(SAT)

l

OUT

= 50 mA

—

1.2

V

l

OUT

= 100 mA

—

1.7

V

Input Voltage

V

IN(1)

3.5

5.3

V

V

IN(0)

-0.3

+0.8

V

Input Current

l

IN(1)

V

IN

= 5.0 V

—

1.0

µA

l

IN(0)

V

IN

= 0 V

—

-1.0

µA

Serial Output Voltage

V

OUT(1)

I

OUT

= -200

µA

4.5

—

V

V

OUT(0)

I

OUT

= 200

µA

—

0.3

V

Supply Current

l

DD

One output ON, l

OUT

= 100 mA

—

1.0

mA

All outputs OFF

—

50

µA

Output Rise Time

t

r

l

OUT

= 100 mA, 10% to 90%

—

500

ns

Output Fall Time

t

f

l

OUT

= 100 mA, 90% to 10%

—

500

ns

NOTE: Positive (negative) current is defined as going into (coming out of) the specified device pin.

Saturation Voltage