LP2996M datasheet(3/26 Pages) TI

3 / 26 page

LP2996-N

www.ti.com

SNOSA40J – NOVEMBER 2002 – REVISED MARCH 2013

Operating Range

Junction Temp. Range(1)

0°C to +125°C

AVIN to GND

2.2V to 5.5V

PVIN Supply Voltage

0 to AVIN

SD Input Voltage

0 to AVIN

(1)

At elevated temperatures, devices must be derated based on thermal resistance. The device in the SOIC-8 package must be derated at

θJA = 151.2° C/W junction to ambient with no heat sink.

Electrical Characteristics

Specifications with standard typeface are for TJ = 25°C and limits in boldface type apply over the full Operating

Temperature Range (TJ = 0°C to +125°C)

(1). Unless otherwise specified, AVIN = PVIN = 2.5V, VDDQ = 2.5V(2).

Symbol

Parameter

Conditions

Min

Typ

Max

Units

VREF

VREF Voltage

VIN = VDDQ = 2.3V

1.135

1.158

1.185

VIN = VDDQ = 2.5V

1.235

1.258

1.285

VIN = VDDQ = 2.7V

1.335

1.358

1.385

ZVREF

VREF Output Impedance

IREF = -30 to +30 μA

2.5

Ω

VTT

VTT Output Voltage

IOUT = 0A

VIN = VDDQ = 2.3V

1.125

1.159

1.190

VIN = VDDQ = 2.5V

1.225

1.259

1.290

VIN = VDDQ = 2.7V

1.325

1.359

1.390

IOUT = ±1.5A

(3)

VIN = VDDQ = 2.3V

1.125

1.159

1.190

VIN = VDDQ = 2.5V

1.225

1.259

1.290

VIN = VDDQ = 2.7V

1.325

1.359

1.390

VosTT/VTT

VTT Output Voltage Offset

IOUT = 0A

-20

(VREF-VTT)

IOUT = -1.5A

(3)

-25

IOUT = +1.5A

(3)

-25

Quiescent Current(4)

IOUT = 0A

(1)

320

500

µA

ZVDDQ

VDDQ Input Impedance

100

Ω

ISD

Quiescent Current in

SD = 0V

115

150

µA

Shutdown(4)

IQ_SD

Shutdown Leakage Current

SD = 0V

µA

VIH

Minimum Shutdown High

1.9

Level

VIL

Maximum Shutdown Low

0.8

Level

VTT Leakage Current in

SD = 0V

µA

Shutdown

VTT = 1.25V

ISENSE

VSENSE Input Current

TSD

Thermal Shutdown

See(5)

165

Celcius

TSD_HYS

Thermal Shutdown Hysteresis

Celcius

(1)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using

Statistical Quality Control (SQC) methods. The limits are used to calculate Texas Instruments' Average Outgoing Quality Level (AOQL).

(2)

VIN is defined as VIN = AVIN = PVIN.

(3)

VTT load regulation is tested by using a 10 ms current pulse and measuring VTT.

(4)

Quiescent current defined as the current flow into AVIN.

(5)

The maximum allowable power dissipation is a function of the maximum junction temperature, TJ(MAX), the junction to ambient thermal

resistance,

θJA, and the ambient temperature, TA. Exceeding the maximum allowable power dissipation will cause excessive die

temperature and the regulator will go into thermal shutdown.

Submit Documentation Feedback

Product Folder Links: LP2996-N

LP2996M Datasheet(PDF) 3 Page - Texas Instruments

LP2996M Datasheet(HTML) 3 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26

Datasheet Download

Link URL