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DS1045 Datasheet(PDF) 3 Page - Dallas Semiconductor |
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DS1045 Datasheet(HTML) 3 Page - Dallas Semiconductor |
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3 / 6 page ![]() DS1045 3 of 6 DELAY VS. PROGRAMMED VALUE Table 2 PART NUMBER OUTPUT DELAY VALUE DS1045-3 9 12 15 18 21 24 27 30 33 36 39 42 45 48 51 54 DS1045-4 9 13 17 21 25 29 33 37 41 45 49 53 57 61 65 69 DS1045-5 9 14 19 24 29 34 39 44 49 54 59 64 69 74 79 84 PROGRAM VALUES FOR EACH DELAY VALUE A0 OR B0 0 1 0 1 0 1 0 1 0 1 0 10101 A1 OR B1 0 0 1 1 0 0 1 1 0 0 1 10011 A2 OR B2 0 0 0 0 1 1 1 1 0 0 0 01111 A3 OR B3 0 0 0 0 0 0 0 0 1 1 1 11111 DS1045 TEST CIRCUIT Figure 2 TEST SETUP DESCRIPTION Figure 2 illustrates the hardware configuration used for measuring the timing parameters of the DS1045. The input waveform is produced by a precision pulse generator under software control. Time delays are measured by a time interval counter (20 ps resolution) connected to the output. The DS1045 parallel inputs are controlled by an interface to a central computer. All measurements are fully automated with each instrument controlled by the computer over an IEEE 488 bus. |
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