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EL2004 Datasheet(PDF) 3 Page - Elantec Semiconductor |
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EL2004 Datasheet(HTML) 3 Page - Elantec Semiconductor |
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3 / 16 page ![]() EL2004EL2004C 350 MHz FET Buffer g 5V DC Electrical Characteristics VS e g5V TMIN k TA k TMAX VIN e 0V RL e 50X unless otherwise specified Parameter Description Test Conditions EL2004 EL2004C Units Min Typ Max Test Min Typ Max Test Level Level VOS Output Offset RS s 100 kX TJ e 25 C 10 30 I 10 30 I mV Voltage RS s 100 kX 35 I 35 III mV AV Voltage Gain VIN e g1V RL e 1kX 090 095 10 I 090 095 10 II VV VIN e g1V 080 088 095 I 080 088 095 II VV RIN Input Impedance TJ e 25 C VIN e g1V 108 1011 I1010 1011 I X ROUT Output VIN e g1VDC 4 8 I 4 10 II X Impedance DRL e 50X to Infinity VO Output Voltage VIN e g4V g 20 g 29 I g 20 g 29 III V Swing IIN Input Current TJ e 25 C (Note 2) 250 I 500 I pA TA e 25 C (Note 3) 25 IV 5 IV nA TJ e TA e TMAX 10 I 20 III nA PSRR Power Supply VS e g5V to g15V 60 V 60 V dB Rejection Ratio RL e 1kX IS Supply Current RL e 1kX 175 20 I 175 20 II mA Note 1 When operating at elevated temperatures the power dissipation of the EL2004 must be limited to the values shown in the typical performance curve ‘‘Maximum Power Dissipation vs Temperature’’ Junction to case thermal resistance is 31 CW when dissipation is spread among the transistors in a normal AC steady-state condition In special conditions where heat is concentrated in one output device junction temperature should be calculated using a thermal resistance of 70 CW Note 2 Specification is at 25 C junction temperature due to requirements of high-speed automatic testing Actual values at operating temperatures will exceed the value at TJ e 25 C When supply voltages are g15V no-load operating junction temperatures may rise 40 Cto60 C above ambient and more under load conditions Accordingly VOS may change one to several mV and IIN will change significantly during warm-up Refer to IIN vs Temperature graph for expected values Note 3 Measured in still air seven minutes after application of power See graph of Input Current During Warm-up for further information Note 4 Bandwidth is calculated from the rise time The EL2004 has a single pole gain and phase response up to the b3dB frequency Note 5 Slew rate is measured between VOUT ea25V and b25V for this test Note 6 Slew rate is measured between VOUT ea1V and b1V for this test Pulse repetition rate is k50 MHz g 15V AC Electrical Characteristics VS e g15V RL e 1kX RS e 50X TJ e 25 C unless otherwise specified Parameter Description Test Conditions EL2004 EL2004C Units Min Typ Max Test Min Typ Max Test Level Level BW Bandwidth (Note 4) 200 350 I 200 350 I MHz RL e 50X 140 200 I 140 200 I MHz ts Settling Time to 1% DVIN e 1V tr e 3ns 6 V 6 V ns Cin Input Capacitance 3 V 3 V pF 3 |
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