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UCC28713 Datasheet(PDF) 2 Page - Texas Instruments |
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UCC28713 Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 32 page ![]() UCC28710, UCC28711 UCC28712, UCC28713 UCC28714, UCC28715 SLUSB86 – NOVEMBER 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. Table 1. PRODUCT INFORMATION(1)(2) PACKAGE PINS MINIMUM ORDERABLE SWITCHING OPTIONS DEVICES FREQUENCY (Hz) UCC28710D Programmable cable compensation NTC option, 0-mV (at 5-V output) cable UCC28711D compensation 680 NTC option, 150-mV (at 5-V output) cable UCC28712D compensation SOIC (D) 7 NTC option, 300-mV (at 5-V output) cable UCC28713D compensation UCC28714D 340 Programmable cable compensation UCC28715D 1500 Programmable cable compensation (1) See Orderable Addendum for specific device ordering information. (2) For other fixed cable compensation options, please consult the factory. ABSOLUTE MAXIMUM RATINGS (1) MIN MAX UNIT Start-up pin voltage, HV VHV 700 V Bias supply voltage, VDD VVDD 38 Continuous gate current sink IDRV 50 Continuous gate current source IDRV Self- limiting mA Peak current, VS IVS −1.2 Gate drive voltage at DRV VDRV −0.5 Self- limiting VS −0.75 7 V Voltage range CS, CBC, NTC −0.5 5 Operating junction temperature range TJ −55 150 Storage temperature TSTG −65 150 °C Lead temperature 0.6 mm from case for 10 seconds 260 Human-body model (HBM) 2000 ESD rating V Charged-device model (CDM) 500 (1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltages are with respect to GND. Currents are positive into, negative out of the specified terminal. These ratings apply over the operating ambient temperature ranges unless otherwise noted. 2 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: UCC28710, UCC28711 UCC28712, UCC28713 UCC28714, UCC28715 |
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