7-364

Specifications CD4020BMS, CD4024BMS, CD4040BMS

Static Burn-In 2

Note 1

3 - 6, 8 - 13

7

1, 2, 14

Dynamic Burn-

In Note 1

8, 10, 13

2, 7

14

3 - 6, 9, 11, 12

1

Irradiation

Note 2

3 - 6, 8 - 13

7

1, 2, 14

PART NUMBER CD4040BMS

Static Burn-In 1

Note 1

1 - 7, 9, 12 - 15

8, 10, 11

16

Static Burn-In 2

Note 1

1 - 7, 9, 12 - 15

8

10, 11, 16

Dynamic Burn-

In Note 1

-

8, 11

16

1 - 7, 9, 12 - 15

10

Irradiation

Note 2

1 - 7, 9, 12 - 15

8

10, 11, 16

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

VDD = 10V

± 0.5V

Functional Diagrams

CD4020BMS

CD4024BMS

CD4040BMS

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

(Continued)

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

INPUT

RESET

Q4

Q5

Q6

Q7

Q8

Q9

Q10

Q11

VSS

VDD

10

11

9

7

5

4

6

13

12

14

16

8

PULSES

Q1

15

1

2

3

Q12

Q13

Q14

14 STAGE

RIPPLE

COUNTER

INPUT

Q1

Q2

Q3

Q4

Q5

Q6

VSS

VDD

12

11

9

6

5

14

7

PULSES

4

3

Q7

7 STAGE

RIPPLE

COUNTER

RESET

1

2

NC = 8, 10, 13

INPUT

RESET

Q2

Q3

Q4

Q5

Q6

Q7

Q8

Q9

VSS

VDD

10

11

9

7

6

5

3

2

4

13

16

8

PULSES

Q1

12

14

15

1

Q10

Q11

Q12

12 STAGE

RIPPLE

COUNTER