6-10

Data Retention Specifications

PARAMETER

SYMBOL

TEST CONDITIONS

UNITS

(V)

(V)

MIN

MAX

MIN

MAX

Minimum Data Retention Voltage

(Note 1)

-

-

-

2

-

2.5

V

Data Retention Quiescent Current

(Note 1)

2

-

-

50

-

200

µA

Chip Deselect to Data Retention Time

-

5

450

-

650

-

ns

Recovery to Normal Operation Time

-

5

450

-

650

-

ns

NOTE:

1. 100% testing. All other limits are designer’s parameters under given test conditions and do not represent 100% testing

Burn-In Circuit

FIGURE 4. DYNAMIC/OPERATING BURN-IN CIRCUIT AND TIMING DIAGRAM

VDR

CS

DATA RETENTION MODE

PACKAGE

TEMPERATURE

DURATION

D

7V

160 Hrs.

14

15

16

9

13

12

11

10

1

2

3

4

5

7

6

8

A11

A0

A1

A2

A3

A4

O1

A9

A8

A7

A6

A5

A10

R

R

R

R

R

R

R

R

R

R

R

R

R

0

1.6

2.2

5.0

6.6

7.2

10.0

O1

A0

A1

0

0

0

µs

A1 - A11 ARE DIVISION BY 2 BASED ON A0

R = 8.2k

Ω 20%

CDP1821C/3