3-172

Spec Number

511062-883

Specifications HA-5222/883

Minimum Closed Loop

Stable Gain

CLSG

1

1

-

V/V

Rise and Fall Time

1, 4

-

20

ns

-

35

ns

Overshoot

±OS

1

-

25

%

-

30

%

Power Consumption

PC

1, 3

-

660

mW

NOTES:

1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-

eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization

based upon data from multiple production runs which reflect lot to lot and within lot variation.

2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2

πV

3. Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.).

4. Measured between 10% and 90% points.

5. Input Noise Voltage Density and Input Noise Current Density limits are based on characterization data.

TABLE 4. ELECTRICAL TEST REQUIREMENTS

MIL-STD-883 TEST REQUIREMENTS

SUBGROUPS (SEE TABLE 1)

Interim Electrical Parameters (Pre Burn-In)

1

Final Electrical Test Parameters

1 (Note 1), 2, 3, 4, 5, 6

Group A Test Requirements

1, 2, 3, 4, 5, 6

Groups C and D Endpoints

1

NOTE:

1. PDA applies to Subgroup 1 only.

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTIC (Continued)

PARAMETERS

SYMBOL

CONDITIONS

NOTES

TEMPERATURE

LIMITS

UNITS

MIN

MAX