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AN4009 Datasheet(PDF) 14 Page - STMicroelectronics |
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AN4009 Datasheet(HTML) 14 Page - STMicroelectronics |
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14 / 23 page ![]() STEVAL-IFP019V1 demonstration board description AN4009 14/23 Doc ID 022458 Rev 1 Figure 14. EFT test set-up according to IEC 61000-4-4 4.5.3 Surge test A high energy surge test was performed in differential mode. A high surge signal was injected on the DUT (device under test) through a 42 Ω decoupling resistor. The test consisted of three positive and three negative discharges with a repetition rate of 1 discharge per minute. Figure 15 shows the standard timing waveform applied on the DUT. |
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