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AN2797 Datasheet(PDF) 13 Page - STMicroelectronics |
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AN2797 Datasheet(HTML) 13 Page - STMicroelectronics |
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13 / 23 page ![]() AN2797 DDR memory interface Doc ID 14841 Rev 1 13/23 or planes. Do not place a decoupling capacitor at the junction of the resistors - only at the Vref balls. If the Vref trace length must be long, the divider resistor value should be close to 2x the characteristic impedance of the Vref trace; 150 ohms should work well without consuming too much power. If a long trace and/or noise coupling results between the DRAM and controller, then it is preferable to generate a separate Vref for the DRAM and controller. 2.8 Observability It is important to be able to observe important signals for system validation, timing, signal quality, and debugging. Place test points on any signals or set of signals that may be needed for these purposes. Always provide a ground via nearby any test points (<4mm) for the probe ground. Only very small test point pads can be used, preferably just a signal via. Or if there is insufficient space, simply a window in the solder mask over a trace can serve the purpose. Do not create test point structures that may significantly degrade signal quality, for example, large test points, stubs, etc. Test points should be located at both ends of the trace (two test points per signal), as close to the device balls as practical (a via next to the ball is preferable, untented on the bottom). It is especially important to be able to observe signals at both the driving and receiving ends of a trace in high-speed interfaces to validate timing parameters, and quantify driver behavior and reflections. Observing a signal at only one end may hide important features that are evident at the other end, even with very short traces as is the case in a point-to- point DDR interface. In a DDR memory interface the routing and component density is too high to add test points on all signals. A subset of DDR signals with test points is a good compromise. Test points for the following DDR signals should be included in all designs: ● CLK/nCLK ● DQS/nDQS (all data lanes) ● DQ (Select a small number of signals that are representative of best and worst signal paths, at least two DQ signals.) ● Address and Command (Select subset of signals that are of interest and that are representative of best and worst signal paths.) |
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