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TC1307 Datasheet(PDF) 2 Page - Microchip Technology

Part # TC1307
Description  Four-Channel CMOS LDO with Select Mode, Shutdown and Independent Reset
PDF  28 Pages
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

TC1307 Datasheet(HTML) 2 Page - Microchip Technology

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TC1307
DS21702A-page 2
 2002 Microchip Technology Inc.
1.0
ELECTRICAL
CHARACTERISTICS
1.1
Maximum Ratings*
VDD..............................................................................6.5V
All inputs and outputs w.r.t. ....... ...VIN + 0.3V to -0.3V
Output Short Circuit Current ...... ...............continuous
Storage temperature.................... .... -65°C to +150°C
Operating Junction Temperature,
TJ..................................................-40°C < TJ < +150°C
Maximum Junction Temperature, TJ..................150°C
ESD protection on all pins...................................
≥ 4 kV
*Notice: Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at those or any other conditions above those
indicated in the operational listings of this specification
is not implied. Exposure to maximum rating conditions
for extended periods may affect device reliability.
PIN FUNCTION TABLE
ELECTRICAL CHARACTERISTICS
Name
Function
VDET
Voltage Detect Input
SHDN1
Shutdown for VOUT1
SELECT12
Input for setting VOUT1 and VOUT2.
VIN
Input Voltage Connection
VIN
Input Voltage Connection
GND
Ground connection
SHDN3
Shutdown for VOUT3
VIN
Input Voltage Connection
SHDN4
Shutdown for VOUT4
SELECT34
Input for setting VOUT3 and VOUT4.
VOUT4
LDO4 Output
VOUT3
LDO3 Output
VOUT2
LDO2 Output
VOUT1
LDO1 Output
SHDN2
Shutdown for VOUT2
RESET
Reset Output
Unless otherwise specified, all limits are established for VIN = VR+1, IL = 100 µA, CL = 3.3 µF, SHDN > VIH, TA = 25°C.
Boldface type specifications apply for junction temperatures, TJ (Note 9) of -40°C to +125°C.
Parameter
Sym
Min
Typ
Max
Units
Conditions
Input Characteristics:
Input Operating Voltage
VIN
2.7
6.0
V
Note 1
Input Quiescent Current
IIN
—220
370
µA
SHDN = VIH, IL = 0
Input Shutdown Current
IIN_SHDN
0.1
0.5
µA
SHDN = 0V
Output Characteristics:
Maximum Output Current
IOUT_MAX
150
—mA
Output Short Circuit Current
(Average)
IOUT_SC
—360
mA
VOUT = 0V
Voltage Regulation
LDO1/LDO2/LDO3/LDO4
VOUT
VR-2.5% VR±0.5
VR+2.5%
V
Note 2
Note 1: The minimum VIN must meet two conditions: VIN ≥ 2.7V and VIN ≥ (VR + 2.5%) + VDROPOUT.
2: VR is the nominal regulator output voltage. For example: VR = 1.8V, 2.5V, 2.8V or 3.0V.
3: TCVOUT = (VOUT-HIGH - VOUT-LOW) * 106 / (VR * ∆Temperature), VOUT-HIGH = Highest voltage measured over the tempera-
ture range. VOUT-LOW = Lowest voltage measured over the temperature range.
4: Load regulation is measured at a constant junction temperature using low duty cycle pulse testing. Load regulation is
tested over a load range from 1mA to the maximum specified output current. Changes in output voltage due to heating
effects are determined using thermal regulation specification TCVOUT.
5: Thermal regulation is defined as the change in output voltage at a time t after a change in power dissipation is applied.
Specifications are for a current pulse equal to ILMAX at VIN = 6.0V for t = 10 msec.
6: Dropout voltage is defined as the input to output differential at which the output voltage drops 2% below its nominal value
with a 1V differential applied.
7: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction temper-
ature and the thermal resistance from junction to air. (i.e. TA, TJ, θJA). Exceeding the maximum allowable power dissipa-
tion will cause the device operating junction temperature to exceed the maximum 150°C rating. Sustained junction
temperatures above 150°C can impact the device reliability.
8: VTH-MIN = 2.55V and VTH-MAX = 2.70V.
9: The Junction temperature is approximated by soaking the device under test at an ambient temperature equal to the
desired Junction temperature. The test time is small enough such that the rise in the Junction temperature over the Ambi-
ent temperature is not significant.



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