MIL-PRF-19500/116L

2

GC, unless otherwise indicated.

Type

(1)

1N914

1N4148-1

1N4531

10

10

10

V dc

0.8

0.8

0.8

50

100

100

V dc

1.2

1.2

1.2

nA dc

25

25

25

2A dc

0.5

0.5

0.5

Type

(1)

GC

GC

1N914

1N4148-1

1N4531

2A dc

35

35

35

2A dc

75

75

75

ns

20

20

20

ns

5

5

5

(1) Electrical characteristics for surface mount devices are equivalent to the corresponding non-surface mount

devices unless otherwise noted.

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This

section does not include documents cited in other sections of this specification or recommended for additional

information or as examples. While every effort has been made to ensure the completeness of this list, document

users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this

specification, whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a

part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are

those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and

supplement thereto, cited in the solicitation (see 6.2).

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-19500

-

Semiconductor Devices, General Specification for.

STANDARD

DEPARTMENT OF DEFENSE

MIL-STD-750

-

Test Methods for Semiconductor Devices.

(Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the

Document Automation and Production Services (DAPS), Building 4D (DPM-DODSSP), 700 Robbins Avenue,

Philadelphia, PA 19111-5094.)