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®

DAC488HR

™

General Information

Support Software

The DAC488HR series is shipped with

Free VIs (Virtual Instruments) are avail-

able from IOtech that enable the immedi-

ate integration of the DAC488HR series

of these ready-to-use VIs provide immedi-

ate access to common DAC488HR func-

tions, and both include source code that

can be modified to meet specific

application requirements.

Stimulus/Response System

When configured with an ADC488A se-

ries A/D converter, the DAC488HR is well-

suited for stimulus/response testing. For

synchronous operation in which acquisi-

tion must begin simultaneously with the

stimulus output, the DAC488HR’s TTL

trigger output is connected directly with

the ADC488A’s TTL trigger input; for non-

synchronous operation in which acquisi-

tion must begin at a specified time after

the stimulus output, the DAC488HR’s trig-

ger output can be “delayed” up to 65,535

update clock counts.

Multi-DAC488HR

Synchronization

Multiple DAC488HRs can be configured

in master/slave mode to synchronously

output data either from their internal

buffers, or continuously from the IEEE

488 bus. When daisy-chained together

using the CA-112 master-slave cable, the

number of DAC488HRs in a system is

limited only by the number of available

IEEE 488 addresses, and the trigger “la-

tency” between each unit is 60 ns*. For

applications that require non-additive trig-

ger latencies, the DAC488HRs can be con-

figured in parallel, limiting total system

trigger latency to 60 ns.

Continuously output a standard

wave function under program

control

Output a series of voltage values

based on TTL triggers

Initiate a trigger delay from 1 to

65,535 update clock pulses

Synchronously output multiple

waveforms under program

control

Output a standard waveform

acquired by the ADC488A series

digitizer

Continuously output a large

arbitrary waveform from the IEEE

488 bus at up to 200 Kbytes/s

Standard function generator

outputs for general purpose

applications

Sequenced V out for controlling

power supplies or other analog

programmable instruments

Allows a device under test (DUT)

to attain a steady state prior to

measurement

Ideal for stimulus/response

applications with critical time

and phase relationships

Ideal for simulating complex

signals such as EKGs and

contact bounce

For audio system testing, speech

research, and other tests

requiring long-time waveform

generation

Waveform(s)

Functional Requirement

Typical Application

T1

T2

T3

T4

trigger event

trigger delay

Analog output signal

* A system with one master and three slave units will have a total system trigger latency of 180 ns