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ADS8345EB Datasheet(PDF) 16 Page - Texas Instruments |
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ADS8345EB Datasheet(HTML) 16 Page - Texas Instruments |
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16 / 18 page ![]() ADS8345 SBAS177C 16 www.ti.com FIGURE 11. Histogram of 5000 Conversions of a DC Input at the Code Center, 2.7V operation external clock mode. VREF = VCOM = 1.25V. output of the analog comparator. Thus, during any single conversion for an n-bit SAR converter, there are n “windows” in which large external transient voltages can easily affect the conversion result. Such glitches might originate from switching power supplies, nearby digital logic, and high- power devices. The degree of error in the digital output depends on the reference voltage, layout, and the exact timing of the external event. The error can change if the external event changes in time with respect to the DCLK input. With this in mind, power to the ADS8345 should be clean and well bypassed. A 0.1 µF ceramic bypass capacitor should be placed as close to the device as possible. In addition, a 1 µF to 10 µF capacitor and a 5Ω or 10Ω series resistor may be used to low-pass filter a noisy supply. The reference should be similarly bypassed with a 0.1 µF capacitor. Again, a series resistor and large capacitor can be used to low-pass filter the reference voltage. If the reference voltage originates from an op amp, make sure that it can drive the bypass capacitor without oscillation (the series resistor can help in this case). The ADS8345 draws very little current from the reference on average, but it does place larger demands on the reference circuitry over short periods of time (on each rising edge of DCLK during a conversion). The ADS8345 architecture offers no inherent rejection of noise or voltage variation in regards to the reference input. This is of particular concern when the reference input is tied to the power supply. Any noise and ripple from the supply will appear directly in the digital results. While high-frequency noise can be filtered out as discussed in the previous paragraph, voltage variation due to line frequency (50Hz or 60Hz) can be difficult to remove. The GND pin should be connected to a clean ground point. In many cases, this will be the “analog” ground. Avoid connections which are too near the grounding point of a microcontroller or digital signal processor. If needed, run a ground trace directly from the converter to the power-supply entry point. The ideal layout will include an analog ground plane dedicated to the converter and associated analog circuitry. AVERAGING The noise of the A/D converter can be compensated by averaging the digital codes. By averaging conversion results, transition noise will be reduced by a factor of 1/ √n, where n is the number of averages. For example, averaging 4 conver- sion results will reduce the transition noise by 1/2 to ±0.25LSBs. Averaging should only be used for input signals with frequencies near DC. For AC signals, a digital filter can be used to low-pass filter and decimate the output codes. This works in a similar manner to averaging: for every decimation by 2, the signal-to-noise ratio will improve 3dB. LAYOUT For optimum performance, care should be taken with the physical layout of the ADS8345 circuitry. This is particularly true if the reference voltage is LOW and/or the conversion rate is HIGH. The basic SAR architecture is sensitive to glitches or sudden changes on the power supply, reference, ground connec- tions, and digital inputs that occur just prior to latching the 64 436 780 2305 938 435 28 8 6 FFFCH FFFDH FFFEH FFFFH Code 0000H 0001H 0002H 0003H 0004H |
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