Electrical Characteristics

Tested Limits

Design Limits

Symbol

Parameter

Conditions

(Note 2)

(Note 3)

Units

Min

Max

Min

Typ

Max

Probe 1 Input

1

5

1

5

V

Voltage Range

1

35

V

Probe 1 Open

At Pin 5

V

Circuit Threshold

Probe 1 Short

05

07

035

06

085

V

Circuit Threshold

Pin 14 Input

b

20

20

20

nA

Leakage Current

Pin 1 Input

b

50

50

15

50

nA

Leakage Current

Repeat Period

12

28

91

17

36

s

70

135

ms

Memory Capacitor Value

047

m

F

Input Capacitor Value

047

m

F

Sensitivity fo Electrostatic Discharge

Pins 7 10 13 and 14 will withstand greater than 1500V when tested using 100 pF and 1500X in accordance with National Semiconductor standard ESD test

procedures

All other pins will withstand in excess of 2 kV

Note 1

Test circuit for over voltage capability at pins 3 6 8

TLH8709 – 2

Note 2

Guaranteed and 100% production tested at 25 C These limits are used to calculate outgoing quality levels

Note 3

figures

Note 4

Variations over temperature range are not production tested

Note 5

Time for first repeat period see

Figure 6

Note 6

11V) having previously been held above

41V to simulate ramp action See Figure 5

Note 7

When measuring gain separate ground wire sensing is required at pin 2 to ensure sufficiently accurate results

Note 8

TLH8709 – 15

G

b

(

b

1

3