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ISO7240CF-Q1 Datasheet(PDF) 13 Page - Texas Instruments |
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ISO7240CF-Q1 Datasheet(HTML) 13 Page - Texas Instruments |
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13 / 27 page ![]() t fs IN OUT 0 V or V 1 CC V CC V I C L NOTE A V O V I V O 50% V CC 0 V V OH V OL 2.7 V fs low V O Input Generator 50 W OUT DISABLE VI IN 0 V VO V I 50 % 50 % t wake VO Input Generator 50 W OUT DISABLE V O V I IN 0 V C L wake t ( Note A) ( Note A ) C L ( Note B ) (Note B ) VCC2 0 V 0 V 0 V 0 V VI CTRL 3 V CTRL 3 V VCC VCC V /2 CC2 VCC2 V /2 CC2 NOTE: Which ever test yields the longest time is used in this data sheet ISO7240CF-Q1, ISO7240C-Q1 ISO7241C-Q1, ISO7242C-Q1 www.ti.com SLLSE40A – SEPTEMBER 2010 – REVISED SEPTEMBER 2011 PARAMETER MEASUREMENT INFORMATION (continued) A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. B. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3 ns, tf ≤ 3 ns, ZO = 50Ω. Figure 3. Failsafe Delay Time Test Circuit and Voltage Waveforms A. Whichever test yields the longest time is used in this data sheet. Figure 4. Wake Time From Input Disable Test Circuit and Voltage Waveforms Copyright © 2010–2011, Texas Instruments Incorporated Submit Documentation Feedback 13 Product Folder Link(s): ISO7240CF-Q1 ISO7241C-Q1 |
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