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83C694 Datasheet(PDF) 13 Page - List of Unclassifed Manufacturers |
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83C694 Datasheet(HTML) 13 Page - List of Unclassifed Manufacturers |
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13 / 33 page ![]() PIN NUMBER MNEMONIC SIGNAL NAME I/O DESCRIPTION 1 COL Collision Detect O A 10 MHz (+25%,-15%) signal at the CD inputs (DTE mode) produces a logic high at the COL output. When no signal is present at the CD inputs, the COL output goes low. In 10BaseT operation, the COL output goes high when TPR+ and TPR- are active while a packet is being transmitted on TPX+/TPX-. COL also goes high during SQE test or jabber condition. 2 NC No Connect I Do not connect any circuitry to this pin. 3 RXD Receive Data O This is the NRZ data output from the on-chip decoder and phase-locked loop. This signal should be sampled by the controller at the rising edge of receive clock. A high level is binary "one", a low level is binary "zero". 4 CRS Carrier Sense O CRS (DTE mode) goes high when valid data i s presen t at the R X+/R X- i np uts or TPR+/TPR- inputs. It goes low after the last bit is received at the inputs. 5 RES Reset/Synch I When RES is low, all internal nodes are set to a known state except for internal clock distri- bution. This improves testing procedures. Normal operation is enabled on the rising edge of RES and while RES is high. The RES pin includes an internal pull up resistor, so it may be left open if unused. 6 RXC Receive Clock O When the phase-locked loop acquires a valid receive signal, a 10MHz clock signal (recov- ered from receive data) is output on RXC. RXC is low during idle (5 bit times after re- ceive activity stops). 7 SEL Mode Select I When SEL is high, TX+ and TX- outputs are at the same voltage in idle state, providing a "zero" differential. When SEL is low, TX+ is positive with respect to TX- in idle state. Also, three test modes may be selected by setting the SEL pin to voltages between low and high levels. Refer to section 2.13 for more on test modes. TABLE 3-1. PIN DESCRIPTION 83C694D PIN DESCRIPTION 10 |
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