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STL33N65M2 Datasheet(PDF) 5 Page - STMicroelectronics |
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STL33N65M2 Datasheet(HTML) 5 Page - STMicroelectronics |
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5 / 15 page ![]() STL33N65M2 Electrical characteristics DocID026089 Rev 3 5/15 Table 8: Source drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 20 A ISDM (1) Source-drain current (pulsed) - 80 A VSD (2) Forward on voltage ISD = 24 A, VGS = 0 V - 1.6 V trr Reverse recovery time ISD = 24 A, di/dt = 100 A/µs VDD = 60 V (see Figure 16: " Test circuit for inductive load switching and diode recovery times") - 426 ns Qrr Reverse recovery charge - 7 µC IRRM Reverse recovery current - 33.5 A trr Reverse recovery time ISD = 24 A, di/dt = 100 A/µs VDD = 60 V, Tj = 150 °C (see Figure 16: " Test circuit for inductive load switching and diode recovery times") - 544 ns Qrr Reverse recovery charge - 10 µC IRRM Reverse recovery current - 36.5 A Notes: (1)Pulse width limited by safe operating area. (2)Pulsed: pulse duration = 300 µs, duty cycle 1.5%. |
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