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STM8AL3146 Datasheet(PDF) 95 Page - STMicroelectronics

Part # STM8AL3146
Description  Automotive 8-bit ultra-low-power MCU, up to 32 Kbyte Flash, RTC, data EEPROM, LCD, timers, USART, I2C, SPI, ADC, DAC, COMPs
PDF  124 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM8AL3146 Datasheet(HTML) 95 Page - STMicroelectronics

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STM8AL313x/4x/6x STM8AL3L4x/6x
Electrical parameters
108
9.3.10
Embedded reference voltage
In the following table, data are based on characterization results, not tested in production,
unless otherwise specified.
Table 49. Reference voltage characteristics
Symbol
Parameter
Conditions
Min
Typ
Max.
Unit
IREFINT
Internal reference voltage
consumption
--
1.4
-
µA
TS_VREFINT(1)(2)
ADC sampling time when reading
the internal reference voltage
--
5
10
µs
IBUF(2)
Internal reference voltage buffer
consumption (used for ADC)
-
-
13.5
25
µA
VREFINT out
Reference voltage output
-
1.202
(3)
1.224
1.242
(3)
V
ILPBUF(2)
Internal reference voltage low
power buffer consumption (used for
comparators or output)
-
-
730
1200
nA
IREFOUT(2)
Buffer output current(4)
--
-
1
µA
CREFOUT
Reference voltage output load
-
-
-
50
pF
tVREFINT
Internal reference voltage startup
time
--
2
3
ms
tBUFEN(2)
Internal reference voltage buffer
startup time once enabled (1)
--
-
10
µs
ACCVREFINT
Accuracy of VREFINT stored in the
VREFINT_Factory_CONV byte(5)
--
-
± 5
mV
STABVREFINT(2)
Stability of VREFINT over
temperature
-40 °C
≤TA ≤
125 °C
-
20
50
ppm/°C
Stability of VREFINT over
temperature
0 °C
≤TA ≤ 50 °C
-
-20
STABVREFINT(2) Stability of VREFINT after 1000 hours
-
--
1000
ppm
1. Defined when ADC output reaches its final value ±1/2LSB
2. Data guaranteed by design. Not tested in production.
3. Tested in production at VDD = 3 V ±10 mV.
4. To guaranty less than 1%
VREFOUT deviation
5. Measured at VDD = 3 V ±10 mV. This value takes into account VDD accuracy and ADC conversion accuracy.



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